The MNE2019 Organizing Committee invites MNE2019 participants to submit papers to four (4) OPEN to all and FOCUSED THEMATICALLY special issues of Micro and Nano Engineering Journal (Gold open access mirror journal of Microelectronic Engineering, Elsevier) entitled:
Your paper and associated supplementary information should comprise a complete, novel and full description of your work. Manuscripts of the special issue will be submitted and reviewed via the online Elsevier Editorial System (EES). At submission, you are presented with a choice between the MEE and MNE journals. You will then receive a confirmation letter on the choice you have made. You will also have a chance to change your choice at revision. To be part of MNE2019 special issues you need to choose MNE journal. Articles will then be processed and published with the standard Elsevier publishing timeline for each individual manuscript following acceptance. Accepted papers will be freely available on ScienceDirect as OPEN ACCESS papers WITHOUT any article processing charges. This is a SPECIAL agreement between MNE2019 conference and MNE journal.
If you choose MEE instead of MNE journal at submission, your manuscript will be treated as a regular paper and will no longer be part of MNE special Issues, although it will still be handled by the same guest editors with the same procedure. Accepted papers in MEE will be published under subscription model only.
Instructions for authors
Please note that the special issue papers undergo the same high-standard review process as any other MEE or MNE paper. At least two reviews need to be in agreement per paper before decision, and the typical rejection rate is 50-60%. Therefore, please make sure that both the technical content of your paper and your presentation style and language are of high quality, and that the content is novel, unpublished, and not being considered for publication elsewhere. Do NOT submit work that is not complete yet, or has partially been published before, even if that work is presented in the conference. Please also note that on-line software is used to check plagiarism and doublicate publications. Please check the author guidelines.